Keysight Technologies, Inc. today announced a new PXI Reference Solution for RF power amplifier (PA) characterization and test. The Reference Solution, which performs S-parameter, harmonic distortion, power and demodulation measurements, enables rapid, full characterization of next-generation power amplifier modules, such as a power amplifier-duplexer (PAD). The Reference Solution is optimized for high throughput and highly accurate measurement quality. It is the only small footprint, full characterization solution for design validation and product test of the RF power amplifier, as well as all of the passive devices surrounding the power amplifier, such as filters and duplexers.

The robust digital pre-distortion (DPD) algorithms in the Reference Solution are built on years of close cooperation with wireless manufacturing customers and insights gained from Keysight’s SystemVue simulation and N7614B Signal Studio for Power Amplifier Test software applications. This makes it the only solution capable of providing consistent measurements, from simulation to manufacturing, for next-generation power amplifier modules.

The proven DPD algorithms, with lookup table (LUT) and memory polynomial capability, complement the solution’s envelope tracking (ET) test capability. The solution includes fast waveform download, tight synchronization and automated calibration, critical for ET test. The Reference Solution supports multiple vendors, such as the Signadyne SD AOU-H3353 single-slot, high-speed PXIe AWG and enables the fastest envelope generation in the industry while reducing the test footprint.

“The combination of Keysight’s excellence in RF solutions and Signadyne’s know-how in high-speed generators has led to development of a comprehensive test solution that provides outstanding value to the RF power amplifier industry,” said Marc Almendros, chief executive officer of Signadyne.

[Link to Press Release]